The SSDM2018 Organizing Committee appreciates the gracious support of the following foundations, organizations and companies.
* Please click on the logos to view companies websites.
Company for Luncheon Seminar
Luncheon Seminar
( Admission Free )
Luncheon Seminar will be held on September 12 at School of Engineering Bldg.2 North Wing 4F Room 241.
The luncheon seminar comes with a lunch box and a pack of tea. A luncheon seminar ticket will be distributed at the registration desk in exchange for your business name card in the following period. The number of the ticket is limited to 100 for the seminar and it will be given on first-come and first-served basis.
You can get a lunch box together with tea in exchange for the ticket at the desk in front of the hall entrance from 15 minutes before the seminar starts.
Notes:
- * Even if all coupons are distributed, additional attendees (without free lunch) will be accepted up to 200.
- * Please provide your name, affiliation, and e-mail address on attending the luncheon seminar.
Schedule
Date |
Presented by |
Application (Ticket) Available |
Door Open |
Seminar Time |
9/12 (Wed.) |
Tektronix Japan / Keithley Japan Language: English |
9/11 (Tue.), 9/12 (Wed.) Registration Desk |
12:00 |
12:15-13:15 |
For Luncheon Seminar details, please click HERE.
Luncheon Seminar details
Tektronix - Luncheon Seminar
- Presenter :
- Katie Wright
- Title :
-
Innovative test solutions for next-generation semiconductor technologies
次世代半導体テクノロジーにおける革新的な測定ソリューション
- Language :
- English
- Abstract :
-
Every day Keithley customers find new and exciting ways to use our products. See how customers like you are harnessing the power of our parameter analyzers, source measure units and other semiconductor test equipment to innovate across a variety of industries. Customer case studies include: <10 ns pulsing for non-volatile memory testing, IV-CV testing on high efficiency dual diode detectors, nanoprobing at 10 nm NMOS and PMOS transistors and more.
日々ケースレーのお客様は、私たちの製品を使用し新しく刺激的な手法を見つけ出しています。本セッションでは、私たちのお客様がさまざまな産業において革新的な製品や技術を生み出すために、パラメータアナライザ、ソース・メジャー・ユニットやその他半導体試験装置をどのように使用しているかご紹介いたします。そのケーススタディには、不揮発性メモリ試験での10nsec以下のパルス測定、高効率のデュアル・ダイオードのIV及びCV測定、10nmスケールのNMOS及びPMOSトランジスタへのナノプロービングによる測定等が含まれます。
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